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Piezoelectric Accelerometers with Integral Electronics (Paperback, Softcover reprint of the original 1st ed. 2015) Loot Price: R3,175
Discovery Miles 31 750
Piezoelectric Accelerometers with Integral Electronics (Paperback, Softcover reprint of the original 1st ed. 2015): Felix...

Piezoelectric Accelerometers with Integral Electronics (Paperback, Softcover reprint of the original 1st ed. 2015)

Felix Levinzon

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Loot Price R3,175 Discovery Miles 31 750 | Repayment Terms: R298 pm x 12*

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This book provides an invaluable reference to Piezoelectric Accelerometers with Integral Electronics (IEPE). It describes the design and performance parameters of IEPE accelerometers and their key elements, PE transducers and FET-input amplifiers. Coverage includes recently designed, low-noise and high temperature IEPE accelerometers. Readers will benefit from the detailed noise analysis of the IEPE accelerometer, which enables estimation of its noise floor and noise limits. Other topics useful for designers of low-noise, high temperature silicon-based electronics include noise analysis of FET amplifiers, experimental investigation and comparison of low-frequency noise in different JFETs and MOSFETs, and ultra-low-noise JFETs (at level of 0.6 nV/√Hz). The discussion also includes ultra-low-noise (at level of 3 ng/√Hz) seismic IEPE accelerometers and high temperature (up to 175 ̊C) triaxial and single axis miniature IEPE accelerometers, along with key factors for their design. • Provides a comprehensive reference to the design and performance of IEPE accelerometers, including low-noise and high temperature IEPE sensors; • Includes noise analysis of the IEPE accelerometer, which enables estimation of the its noise floor and noise limits; • Describes recently design of ultra-low-noise (at level of 3 ng/√Hz) IEPE seismic accelerometers and high temperature (up to 175 ̊C) triaxial and single axis miniature IEPE accelerometers; • Compares low-frequency noise in different JFETs and MOSFETs including measurement results of ultra-low-noise (at level of 0.6 nV/√Hz) JFET; • Presents key factors for design of low-noise and high temperature IEPE accelerometer and their electronics.

General

Imprint: Springer International Publishing AG
Country of origin: Switzerland
Release date: September 2016
First published: 2015
Authors: Felix Levinzon
Dimensions: 235 x 155 x 10mm (L x W x T)
Format: Paperback
Pages: 169
Edition: Softcover reprint of the original 1st ed. 2015
ISBN-13: 978-3-319-35611-2
Categories: Books > Professional & Technical > Mechanical engineering & materials > Mechanical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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LSN: 3-319-35611-9
Barcode: 9783319356112

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