Fundamentals of Electromigration-Aware Integrated Circuit Design (Paperback, Softcover reprint of the original 1st ed. 2018)

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensive set of options is presented for modifying the present IC design methodology to prevent electromigration. Finally, the authors show how specific effects can be exploited in present and future technologies to reduce electromigration's negative impact on circuit reliability.

General

Imprint:	Springer Nature Switzerland AG
Country of origin:	Switzerland
Release date:	December 2018
First published:	2018
Authors:	Jens Lienig • Matthias Thiele
Dimensions:	235 x 155mm (L x W)
Format:	Paperback
Pages:	159
Edition:	Softcover reprint of the original 1st ed. 2018
ISBN-13:	978-3-03-008811-8
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design > General
LSN:	3-03-008811-1
Barcode:	9783030088118

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