An up-to-date overview of the different x-ray based methods in the
hot fields of nanoscience and nanotechnology, including methods for
imaging nanomaterials, as well as for probing the electronic
structure of nanostructured materials in order to investigate their
different properties. Written by authors at one of the world's top
facilities working with these methods, this monograph presents and
discusses techniques and applications in the fields of x-ray
scattering, spectroscopy and microscope imaging.
The resulting systematic collection of these advanced tools will
benefit graduate students, postdocs as well as professional
researchers.
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