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Binary Decision Diagrams and Extensions for System Reliability Analysis (Hardcover)
Loot Price: R4,237
Discovery Miles 42 370
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Binary Decision Diagrams and Extensions for System Reliability Analysis (Hardcover)
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Recent advances in science and technology have made modern
computing and engineering systems more powerful and sophisticated
than ever. The increasing complexity and scale imply that system
reliability problems not only continue to be a challenge but also
require more efficient models and solutions. This is the first book
systematically covering the state-of-the-art binary decision
diagrams and their extended models, which can provide efficient and
exact solutions to reliability analysis of large and complex
systems. The book provides both basic concepts and detailed
algorithms for modelling and evaluating reliability of a wide range
of complex systems, such as multi-state systems, phased-mission
systems, fault-tolerant systems with imperfect fault coverage,
systems with common-cause failures, systems with disjoint failures,
and systems with functional dependent failures. These types of
systems abound in safety-critical or mission-critical applications
such as aerospace, circuits, power systems, medical systems,
telecommunication systems, transmission systems, traffic light
systems, data storage systems, and etc. The book provides both
small-scale illustrative examples and large-scale benchmark
examples to demonstrate broad applications and advantages of
different decision diagrams based methods for complex system
reliability analysis. Other measures including component importance
and failure frequency are also covered. A rich set of references is
cited in the book, providing helpful resources for readers to
pursue further research and study of the topics. The target
audience of the book is reliability and safety engineers or
researchers. The book can serve as a textbook on system reliability
analysis. It can also serve as a tutorial and reference book on
decision diagrams, multi-state systems, phased-mission systems, and
imperfect fault coverage models.
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