Terrestrial Neutron-induced Soft Error In Advanced Memory Devices (Hardcover)

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

General

Imprint:	World Scientific Publishing Co Pte Ltd
Country of origin:	Singapore
Release date:	April 2008
First published:	March 2008
Authors:	Takashi Nakamura • Eishi Ibe • Mamoru Baba • Yasuo Yahagi • Hideaki Kameyama
Dimensions:	237 x 162 x 20mm (L x W x T)
Format:	Hardcover
Pages:	368
ISBN-13:	978-981-277-881-9
Categories:	Books > Computing & IT > Computer hardware & operating systems > Storage media & peripherals
LSN:	981-277-881-0
Barcode:	9789812778819

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