Spectroscopy is a versatile tool for the characterization of
materials, and photons in the visible frequency range of the
electromagnetic spectrum have been used successfully for more than
a century now. But other elementary particles such as neutrons,
muons and x-ray photons have been proven to be useful probes as
well and are routinely generated in modern cyclotrons and
synchrotrons. They offer attractive alternative ways of probing
condensed matter in order to better understand its properties and
to correlate material behavior with its structure. In particular,
the combination of these different spectroscopic probes yields rich
information on the material samples, thereby allowing for a
systematic investigation down to atomic resolutions. This book
gives a practical account of how well they complement each other
for 21st century material characterization, and provides the basis
for a detailed understanding of the scattering processes and the
knowledge of the relevant microscopic interactions necessary for
the correct interpretation of the experimentally obtained
spectroscopic data.
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