This book is the first resource to review the influence of climate change on urban and public pests such as mosquitoes, flies, ticks, and wood pests, with respect to population, distribution, disease, damage and control. It systematically addresses how the impact of climate change on pests in urban areas differs from natural areas, focusing on the increased temperatures of urban locations, the effect of natural disasters, the manner of land use and the consequences of human habitation. Climate Change Impacts on Urban Pests: - covers key information on how climate change and urban pests affect human health - includes coverage of the impacts of natural disasters such as flooding looks at issues which could influence the management of pests - explores a range of international opinion from recognised authorities covering six continents. Presenting up-to-date knowledge, this book is an essential resource for researchers in urban pests, entomology and public health, as well as scientists, environmentalists and policy makers involved in studies on climate change.

The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool. Presenting the principles, capabilities, challenges and applications of the FIB technique, this edited volume, first published in 2007, comprehensively covers the ion beam technology including the DualBeam. The basic principles of ion beam and two-beam systems, their interaction with materials, etching and deposition are all covered, as well as in situ materials characterization, sample preparation, three-dimensional reconstruction and applications in biomaterials and nanotechnology. With nanostructured materials becoming increasingly important in micromechanical, electronic and magnetic devices, this self-contained review of the range of ion beam methods, their advantages, and when best to implement them is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.