This book applies to the scientific area of electronic design automation (EDA) and addresses the automatic sizing of analog integrated circuits (ICs). Particularly, this book presents an approach to enhance a state-of-the-art layout-aware circuit-level optimizer (GENOM-POF), by embedding statistical knowledge from an automatically generated gradient model into the multi-objective multi-constraint optimization kernel based on the NSGA-II algorithm. The results showed allow the designer to explore the different trade-offs of the solution space, both through the achieved device sizes, or the respective layout solutions.

This book presents an innovative methodology for the automatic generation of analog integrated circuits (ICs) layout, based on template descriptions and on evolutionary computational techniques. A design automation tool, LAYGEN II was implemented to validate the proposed approach giving special emphasis to reusability of expert design knowledge and to efficiency on retargeting operations.

"

This book addresses the automatic sizing and layout of analog integrated circuits (ICs) using deep learning (DL) and artificial neural networks (ANN). It explores an innovative approach to automatic circuit sizing where ANNs learn patterns from previously optimized design solutions. In opposition to classical optimization-based sizing strategies, where computational intelligence techniques are used to iterate over the map from devices' sizes to circuits' performances provided by design equations or circuit simulations, ANNs are shown to be capable of solving analog IC sizing as a direct map from specifications to the devices' sizes. Two separate ANN architectures are proposed: a Regression-only model and a Classification and Regression model. The goal of the Regression-only model is to learn design patterns from the studied circuits, using circuit's performances as input features and devices' sizes as target outputs. This model can size a circuit given its specifications for a single topology. The Classification and Regression model has the same capabilities of the previous model, but it can also select the most appropriate circuit topology and its respective sizing given the target specification. The proposed methodology was implemented and tested on two analog circuit topologies.