Built-in-Self-Test and Digital Self-Calibration for RF SoCs (Paperback, 2012)

This book will introduce design methodologies, known as Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC), which enhance the robustness of radio frequency (RF) and millimeter wave (mmWave) integrated circuits (ICs). These circuits are used in current and emerging communication, computing, multimedia and biomedical products and microchips. The design methodologies presented will result in enhancing the yield (percentage of working chips in a high volume run) of RF and mmWave ICs which will enable successful manufacturing of such microchips in high volume.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Series:	SpringerBriefs in Electrical and Computer Engineering
Release date:	October 2011
First published:	2012
Authors:	Sleiman Bou-Sleiman • Mohammed Ismail
Dimensions:	235 x 155 x 5mm (L x W x T)
Format:	Paperback
Pages:	89
Edition:	2012
ISBN-13:	978-1-4419-9547-6
Categories:	Books > Computing & IT > Applications of computing > Signal processing Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN:	1-4419-9547-1
Barcode:	9781441995476

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