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Books > Computing & IT > Applications of computing > Signal processing
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs (Paperback, 2012)
Loot Price: R1,521
Discovery Miles 15 210
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Built-in-Self-Test and Digital Self-Calibration for RF SoCs (Paperback, 2012)
Series: SpringerBriefs in Electrical and Computer Engineering
Expected to ship within 10 - 15 working days
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This book will introduce design methodologies, known as
Built-in-Self-Test (BiST) and Built-in-Self-Calibration (BiSC),
which enhance the robustness of radio frequency (RF) and millimeter
wave (mmWave) integrated circuits (ICs). These circuits are used in
current and emerging communication, computing, multimedia and
biomedical products and microchips. The design methodologies
presented will result in enhancing the yield (percentage of working
chips in a high volume run) of RF and mmWave ICs which will enable
successful manufacturing of such microchips in high volume.
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