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Introduction to Mathematical Statistics, Global Edition (Paperback, 8th edition): Robert Hogg, Joeseph McKean, Allen Craig Introduction to Mathematical Statistics, Global Edition (Paperback, 8th edition)
Robert Hogg, Joeseph McKean, Allen Craig
R2,260 Discovery Miles 22 600 Ships in 12 - 17 working days

For courses in mathematical statistics. Comprehensive coverage of mathematical statistics - with a proven approach Introduction to Mathematical Statistics by Hogg, McKean, and Craig enhances student comprehension and retention with numerous, illustrative examples and exercises. Classical statistical inference procedures in estimation and testing are explored extensively, and the text's flexible organisation makes it ideal for a range of mathematical statistics courses. Substantial changes to the 8th Edition - many based on user feedback - help students appreciate the connection between statistical theory and statistical practice, while other changes enhance the development and discussion of the statistical theory presented.

Oxide Semiconductors and Thin Films: Volume 1494 (Hardcover): Andre Schleife, Martin Allen, Craig B. Arnold, Steven M Durbin,... Oxide Semiconductors and Thin Films: Volume 1494 (Hardcover)
Andre Schleife, Martin Allen, Craig B. Arnold, Steven M Durbin, Nini Pryds, …
R2,068 Discovery Miles 20 680 Ships in 12 - 17 working days

Symposium Z, 'Oxide Semiconductors', and Symposium F, 'Oxide Thin Films for Renewable Energy Applications', were held November 25-30 at the 2012 MRS Fall Meeting in Boston, Massachusetts. Oxide materials are attracting considerable attention both as semiconductors for a wide range of potential device applications but also in energy research spanning from photo- and electro-catalysis, to electrolytes and electrodes used in batteries or fuel cells. This symposium proceedings volume collects recent reports from the meeting aimed at providing a fundamental understanding of bulk oxide materials as well as thin films and nano-structures. The topics covered in this volume are quite broad and include such areas as growth and doping, defects and characterisation, and device applications.

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