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Particle simulation of semiconductor devices is a rather new field
which has started to catch the interest of the world's scientific
community. It represents a time-continuous solution of Boltzmann's
transport equation, or its quantum mechanical equivalent, and the
field equation, without encountering the usual numerical problems
associated with the direct solution. The technique is based on
first physical principles by following in detail the transport
histories of indi vidual particles and gives a profound insight
into the physics of semiconductor devices. The method can be
applied to devices of any geometrical complexity and material
composition. It yields an accurate description of the device, which
is not limited by the assumptions made behind the alternative drift
diffusion and hydrodynamic models, which represent approximate
solutions to the transport equation. While the development of the
particle modelling technique has been hampered in the past by the
cost of computer time, today this should not be held against using
a method which gives a profound physical insight into individual
devices and can be used to predict the properties of devices not
yet manufactured. Employed in this way it can save the developer
much time and large sums of money, both important considerations
for the laboratory which wants to keep abreast of the field of
device research. Applying it to al ready existing electronic
components may lead to novel ideas for their improvement. The Monte
Carlo particle simulation technique is applicable to
microelectronic components of any arbitrary shape and complexity.
Particle simulation of semiconductor devices is a rather new field
which has started to catch the interest of the world's scientific
community. It represents a time-continuous solution of Boltzmann's
transport equation, or its quantum mechanical equivalent, and the
field equation, without encountering the usual numerical problems
associated with the direct solution. The technique is based on
first physical principles by following in detail the transport
histories of indi vidual particles and gives a profound insight
into the physics of semiconductor devices. The method can be
applied to devices of any geometrical complexity and material
composition. It yields an accurate description of the device, which
is not limited by the assumptions made behind the alternative drift
diffusion and hydrodynamic models, which represent approximate
solutions to the transport equation. While the development of the
particle modelling technique has been hampered in the past by the
cost of computer time, today this should not be held against using
a method which gives a profound physical insight into individual
devices and can be used to predict the properties of devices not
yet manufactured. Employed in this way it can save the developer
much time and large sums of money, both important considerations
for the laboratory which wants to keep abreast of the field of
device research. Applying it to al ready existing electronic
components may lead to novel ideas for their improvement. The Monte
Carlo particle simulation technique is applicable to
microelectronic components of any arbitrary shape and complexity."
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