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This text presents a wide-ranging and rigorous overview of nearest
neighbor methods, one of the most important paradigms in machine
learning. Now in one self-contained volume, this book
systematically covers key statistical, probabilistic, combinatorial
and geometric ideas for understanding, analyzing and developing
nearest neighbor methods. Gerard Biau is a professor at Universite
Pierre et Marie Curie (Paris). Luc Devroye is a professor at the
School of Computer Science at McGill University (Montreal).
This book is devoted to Professor Jurgen Lehn, who passed away on
September 29, 2008, at the age of 67. It contains invited papers
that were presented at the Wo- shop on Recent Developments in
Applied Probability and Statistics Dedicated to the Memory of
Professor Jurgen Lehn, Middle East Technical University (METU),
Ankara, April 23-24, 2009, which was jointly organized by the
Technische Univ- sitat Darmstadt (TUD) and METU. The papers present
surveys on recent devel- ments in the area of applied probability
and statistics. In addition, papers from the Panel Discussion:
Impact of Mathematics in Science, Technology and Economics are
included. Jurgen Lehn was born on the 28th of April, 1941 in
Karlsruhe. From 1961 to 1968 he studied mathematics in Freiburg and
Karlsruhe, and obtained a Diploma in Mathematics from the
University of Karlsruhe in 1968. He obtained his Ph.D. at the
University of Regensburg in 1972, and his Habilitation at the
University of Karlsruhe in 1978. Later in 1978, he became a C3
level professor of Mathematical Statistics at the University of
Marburg. In 1980 he was promoted to a C4 level professorship in
mathematics at the TUD where he was a researcher until his death."
Density estimation has evolved enormously since the days of bar plots and histograms, but researchers and users are still struggling with the problem of the selection of the bin widths. This text explores a new paradigm for the data-based or automatic selection of the free parameters of density estimates in general so that the expected error is within a given constant multiple of the best possible error. The paradigm can be used in nearly all density estimates and for most model selection problems, both parametric and nonparametric. It is the first book on this topic. The text is intended for first-year graduate students in statistics and learning theory, and offers a host of opportunities for further research and thesis topics. Each chapter corresponds roughly to one lecture, and is supplemented with many classroom exercises. A one year course in probability theory at the level of Feller's Volume 1 should be more than adequate preparation. Gabor Lugosi is Professor at Universitat Pompeu Fabra in Barcelona, and Luc Debroye is Professor at McGill University in Montreal. In 1996, the authors, together with Lászlo Györfi, published the successful text, A Probabilistic Theory of Pattern Recognition with Springer-Verlag. Both authors have made many contributions in the area of nonparametric estimation.
A self-contained and coherent account of probabilistic techniques, covering: distance measures, kernel rules, nearest neighbour rules, Vapnik-Chervonenkis theory, parametric classification, and feature extraction. Each chapter concludes with problems and exercises to further the readers understanding. Both research workers and graduate students will benefit from this wide-ranging and up-to-date account of a fast- moving field.
This book is devoted to Professor Jurgen Lehn, who passed away on
September 29, 2008, at the age of 67. It contains invited papers
that were presented at the Wo- shop on Recent Developments in
Applied Probability and Statistics Dedicated to the Memory of
Professor Jurgen Lehn, Middle East Technical University (METU),
Ankara, April 23-24, 2009, which was jointly organized by the
Technische Univ- sitat Darmstadt (TUD) and METU. The papers present
surveys on recent devel- ments in the area of applied probability
and statistics. In addition, papers from the Panel Discussion:
Impact of Mathematics in Science, Technology and Economics are
included. Jurgen Lehn was born on the 28th of April, 1941 in
Karlsruhe. From 1961 to 1968 he studied mathematics in Freiburg and
Karlsruhe, and obtained a Diploma in Mathematics from the
University of Karlsruhe in 1968. He obtained his Ph.D. at the
University of Regensburg in 1972, and his Habilitation at the
University of Karlsruhe in 1978. Later in 1978, he became a C3
level professor of Mathematical Statistics at the University of
Marburg. In 1980 he was promoted to a C4 level professorship in
mathematics at the TUD where he was a researcher until his death.
Pattern recognition presents one of the most significant challenges
for scientists and engineers, and many different approaches have
been proposed. The aim of this book is to provide a self-contained
account of probabilistic analysis of these approaches. The book
includes a discussion of distance measures, nonparametric methods
based on kernels or nearest neighbors, Vapnik-Chervonenkis theory,
epsilon entropy, parametric classification, error estimation, free
classifiers, and neural networks. Wherever possible,
distribution-free properties and inequalities are derived. A
substantial portion of the results or the analysis is new. Over 430
problems and exercises complement the material.
Thls text ls about one small fteld on the crossroads of statlstlcs,
operatlons research and computer sclence. Statistleians need random
number generators to test and compare estlmators before uslng them
ln real l!fe. In operatlons research, random numbers are a key
component ln !arge scale slmulatlons. Computer sclen- tlsts need
randomness ln program testlng, game playlng and comparlsons of
algo- rlthms. The appl!catlons are wlde and varled. Yet all depend
upon the same com- puter generated random numbers. Usually, the
randomness demanded by an appl!catlon has some bullt-ln structure:
typlcally, one needs more than just a sequence of Independent
random blts or Independent uniform [0,1] random vari- ables. Some
users need random variables wlth unusual densltles, or random com-
blnatorlal objects wlth speclftc propertles, or random geometrlc
objects, or ran- dom processes wlth weil deftned dependence
structures. Thls ls preclsely the sub- ject area of the book, the
study of non-uniform random varlates. The plot evolves around the
expected complexlty of random varlate genera- tlon algorlthms. We
set up an ldeal!zed computatlonal model (wlthout overdolng lt), we
lntroduce the notlon of unlformly bounded expected complexlty, and
we study upper and lower bounds for computatlonal complexlty. In
short, a touch of computer sclence ls added to the fteld. To keep
everythlng abstract, no tlmlngs or computer programs are lncluded.
Thls was a Iabor of Iove. George Marsagl!a created CS690, a course
on ran- dom number generat!on at the School of Computer Sclence of
McG!ll Unlverslty.
Density estimation has evolved enormously since the days of bar
plots and histograms, but researchers and users are still
struggling with the problem of the selection of the bin widths.
This book is the first to explore a new paradigm for the data-based
or automatic selection of the free parameters of density estimates
in general so that the expected error is within a given constant
multiple of the best possible error. The paradigm can be used in
nearly all density estimates and for most model selection problems,
both parametric and nonparametric.
This text presents a wide-ranging and rigorous overview of nearest
neighbor methods, one of the most important paradigms in machine
learning. Now in one self-contained volume, this book
systematically covers key statistical, probabilistic, combinatorial
and geometric ideas for understanding, analyzing and developing
nearest neighbor methods. Gerard Biau is a professor at Universite
Pierre et Marie Curie (Paris). Luc Devroye is a professor at the
School of Computer Science at McGill University (Montreal).
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