The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.

Energy-Filtering Transmission Electron Microscopy (EFTEM) presents a summary of the electron optics, the electron-specimen interactions, and the operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionisations is of increasing interest for a quantitative application of EFTEM in materials and life sciences. This can be realized not only by filtering the elastically scattered electrons but mainly by imgaging and analyzing with inelastically scattered electrons at different energy losses up to 2000 eV. The strength of EFTEM is the combination of the modes EELS, ESI, ESD and REM.

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

The aim of this monograph is to outline the physics of image formation, electron-specimen interactions, and image interpretation in transmission el- tron microscopy. Since the last edition, transmission electron microscopy has undergone a rapid evolution. The introduction of monochromators and - proved energy ?lters has allowed electron energy-loss spectra with an energy resolution down to about 0.1 eV to be obtained, and aberration correctors are now available that push the point-to-point resolution limit down below 0.1 nm. After the untimely death of Ludwig Reimer, Dr. Koelsch from Springer- Verlag asked me if I would be willing to prepare a new edition of the book. As it had served me as a reference for more than 20 years, I agreed without hesitation. Distinct from more specialized books on speci?c topics and from books intended for classroom teaching, the Reimer book starts with the basic principles and gives a broad survey of the state-of-the-art methods, comp- mented by a list of references to allow the reader to ?nd further details in the literature. The main objective of this revised edition was therefore to include the new developments but leave the character of the book intact. The presentation of the material follows the format of the previous e- tion as outlined in the preface to that volume, which immediately follows. A few derivations have been modi?ed to correspond more closely to modern textbooks on quantum mechanics, scattering theory, or solid state physics.

Unter Epitaxie versteht man das orientierte Aufwachsen dunner Schichten auf einer kristallinen Unterlage. Im Idealfall erreicht man einkristalline Schichten, welche die Kristallorientierung der Unterlage fortsetzen. Bei der Aufdampf methode muss man in der Regel erhohte Temperaturen der Unterlage wahrend des Aufdampfprozesses anwenden, um Epitaxie zu erreichen. In vielen Fallen spielen auch Adsorptionsschichten auf den kristallinen Unterlagen eine Rolle. Zum Bei spiel wurde in der vorliegenden Arbeit die Epitaxie von Eisenschichten auf Stein salz-Spaltflachen durch den H 0-Partialdruck begunstigt. 2 Das praktische Interesse an einkristallinen Schichten beruht darauf, dass deren physikalische Eigenschaften besser mit denen des kompakten Materials zu ver gleichen sind als polykristalline Schichten mit regelloser Kristallorientierung, die man beim Aufdampfen auf amorpher Unterlage (Glas oder Kunststoff-Folien) er halt. In der vorliegenden Arbeit sind die Bedingungen untersucht, unter denen ein kristalline Wismut- und Eisen-Aufdampfschichten zu erhalten sind. Wismut zeigt wegen seiner Grenzstellung zwischen Metallen und Halbleitern einen relativ grossen Hall-Effekt, der ausserdem sehr anisotrop ist und in Abhangigkeit von der Orientierung das Vorzeichen wechseln kann. Den hohen Hall-Koeffizienten kann man zur Messung magnetischer Felder mit Hall-Sonden ausnutzen. Um den Ein fluss einer abnehmenden Schichtdicke auf den Hall-Effekt zu untersuchen, war es erwunscht, auch Messungen an einkristallinen Schichten verschiedener Orien tierung durchzufuhren. Ein positives Vorzeichen des Hall-Effektes ist zu erwarten, wenn die (lll)-Ebene parallel zur Schicht liegt und das transversale Magnetfeld in Richtung der trigonalen Achse zeigt. Derartig orientierte Schichten konnten durch Epitaxie auf Glimmer-Spaltflachen erhalten werden."