Vol. 2 of "Progress in Materials Analysis" contains the lectures of the 12th Colloquium on Materials Analysis, Vienna, May 13-15, 1985. Due to the top level international participation from industry and research insti tutions the proceedings offer a survey of the present state and current trends in materials analysis of high actuality. The major topics covered are surface, micro and trace analysis of materials with a special emphasis on metals but also including other materials like ceramics, semiconductors, polymers. According to the strategy of the meeting attention is focussed on an interdisciplinary approach to materials science - combining analytical chemistry, solid state physics and technol ogy. Therefore progress reports on modern analytical technique like SIMS, SNMS, AES, XPS, Positron Annihilation Spectroscopy, EPMA, STEM, LAMMS, etc. are contained as well as presentations on the development of materials. The majority of the contributions centers on the treatment of important problems in materials science and technology by a (mostly sophisticated) combination of physical and chemical analytical techniques. Vienna, July 1985 M. Grasserbauer Contents Page Hercules, D. M. Surface Characterization of Thin Organic Films on Metals ............................................. ."

The journal Chemometrics and Intelligent Laboratory Systems has a specific policy of publishing tutorial papers, (i.e. articles aiming to discuss and illustrate the application of chemometric and other techniques) solicited from leading experts in the varied disciplines relating to this subject. This book comprises reprints of tutorials from the first 5 volumes of this journal, covering the period from late 1986 to mid 1989. The authors of the papers include analytical, organic and environmental chemists, statisticians, pharmacologists, geologists, geochemists, computer scientists and biologists, which reflects the strong interdisciplinary communication. The papers have been reorganized into major themes, covering most of the main areas of chemometrics.
This book is intended both as a personal reference text and as a useful background for courses in chemometrics and laboratory computing.