The Analogue-to-digital converter (ADC) is the most pervasive block
in electronic systems. With the advent of powerful digital signal
processing and digital communication techniques, ADCs are fast
becoming critical components for systema (TM)s performance and
flexibility. Knowing accurately all the parameters that
characterise their dynamic behaviour is crucial, on one hand to
select the most adequate ADC architecture and characteristics for
each end application, and on the other hand, to understand how they
affect performance bottlenecks in the signal processing chain.
Dynamic Characterisation of Analogue-to-Digital Converters
presents a state of the art overview of the methods and procedures
employed for characterising ADCsa (TM) dynamic performance
behaviour using sinusoidal stimuli. The three classical methods a"
histogram, sine wave fitting, and spectral analysis a" are
thoroughly described, and new approaches are proposed to circumvent
some of their limitations.
This is a must-have compendium, which can be used by both
academics and test professionals to understand the fundamental
mathematics underlining the algorithms of ADC testing, and as an
handbook to help the engineer in the most important and critical
details for their implementation.
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