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Smart and Flexible Digital-to-Analog Converters (Paperback, 2011 ed.)
Loot Price: R4,237
Discovery Miles 42 370
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Smart and Flexible Digital-to-Analog Converters (Paperback, 2011 ed.)
Series: Analog Circuits and Signal Processing
Expected to ship within 10 - 15 working days
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Smart and Flexible Digital-to-Analog Converters proposes new
concepts and implementations for flexibility and self-correction of
current-steering digital-to-analog converters (DACs) which allow
the attainment of a wide range of functional and performance
specifications, with a much reduced dependence on the fabrication
process. DAC linearity is analysed with respect to the accuracy of
the DAC unit elements. A classification is proposed of the many
different current-steering DAC correction methods. The
classification reveals methods that do not yet exist in the open
literature. Further, this book systematically analyses
self-calibration correction methods for the various DAC mismatch
errors. For instance, efficient calibration of DAC binary currents
is identified as an important missing method. This book goes on to
propose a new methodology for correcting mismatch errors of both
nominally identical unary as well as scaled binary DAC currents. A
new concept for DAC flexibility is presented. The associated
architecture is based on a modular design approach that uses
parallel sub-DAC units to realize flexible design, functionality
and performance. Two main concepts, self-calibration and
flexibility, are demonstrated in practice using three DAC testchips
in 250nm, 180nm and 40nm standard CMOS. Smart and Flexible
Digital-to-Analog Converters will be useful to both advanced
professionals and newcomers in the field. Advanced professionals
will find new methods that are fully elaborated from analysis at
conceptual level to measurement results at test-chip level. New
comers in the field will find structured knowledge of fully
referenced state-of-the art methods with many fully explained
novelties.<
DAC linearity is analysed with respect to the accuracy of the DAC
unit elements. A classification is proposed of the many different
current-steering DAC correction methods. The classification reveals
methods that do not yet exist in the open literature. Further, this
book systematically analyses self-calibration correction methods
for the various DAC mismatch errors. For instance, efficient
calibration of DAC binary currents is identified as an important
missing method. This book goes on to propose a new methodology for
correcting mismatch errors of both nominally identical unary as
well as scaled binary DAC currents. A new concept for DAC
flexibility is presented. The associated architecture is based on a
modular design approach that uses parallel sub-DAC units to realize
flexible design, functionality and performance. Two main concepts,
self-calibration and flexibility, are demonstrated in practice
using three DAC testchips in 250nm, 180nm and 40nm standard CMOS.
Smart and Flexible Digital-to-Analog Converters will be useful to
both advanced professionals and newcomers in the field. Advanced
professionals will find new methods that are fully elaborated from
analysis at conceptual level to measurement results at test-chip
level. New comers in the field will find structured knowledge of
fully referenced state-of-the art methods with many fully explained
novelties. This book goes on to propose a new methodology for
correcting mismatch errors of both nominally identical unary as
well as scaled binary DAC currents. A new concept for DAC
flexibility is presented. The associated architecture is based on a
modular design approach that uses parallel sub-DAC units to realize
flexible design, functionality and performance. Two main concepts,
self-calibration and flexibility, are demonstrated in practice
using three DAC testchips in 250nm, 180nm and 40nm standard CMOS.
Smart and Flexible Digital-to-Analog Converters will be useful to
both advanced professionals and newcomers in the field. Advanced
professionals will find new methods that are fully elaborated from
analysis at conceptual level to measurement results at test-chip
level. New comers in the field will find structured knowledge of
fully referenced state-of-the art methods with many fully explained
novelties. Two main concepts, self-calibration and flexibility, are
demonstrated in practice using three DAC testchips in 250nm, 180nm
and 40nm standard CMOS. Smart and Flexible Digital-to-Analog
Converters will be useful to both advanced professionals and
newcomers in the field. Advanced professionals will find new
methods that are fully elaborated from analysis at conceptual level
to measurement results at test-chip level. New comers in the field
will find structured knowledge of fully referenced state-of-the art
methods with many fully explained novelties.
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