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Books > Professional & Technical > Mechanical engineering & materials > Materials science

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X-Ray Line Profile Analysis in Materials Science (Hardcover) Loot Price: R6,121

Discovery Miles 61 210

Repayment Terms: R574 pm x 12*

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X-Ray Line Profile Analysis in Materials Science (Hardcover)

Jen Gubicza

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Loot Price R6,121 Discovery Miles 61 210 | Repayment Terms: R574 pm x 12*

Expected to ship within 10 - 15 working days

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X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

General

Imprint:	Idea Group,U.S.
Country of origin:	United States
Release date:	March 2014
First published:	March 2014
Authors:	Jen Gubicza
Dimensions:	229 x 152 x 25mm (L x W x T)
Format:	Hardcover - Cloth over boards
Pages:	359
ISBN-13:	978-1-4666-5852-3
Categories:	Books > Professional & Technical > Mechanical engineering & materials > Materials science > General Promotions
LSN:	1-4666-5852-5
Barcode:	9781466658523