X-ray line profile analysis is an effective and non-destructive
method for the characterization of the microstructure in
crystalline materials. Supporting research in the area of x-ray
line profile analysis is necessary in promoting further
developments in this field. X-Ray Line Profile Analysis in
Materials Science aims to synthesize the existing knowledge of the
theory, methodology, and applications of x-ray line profile
analysis in real-world settings. This publication presents both the
theoretical background and practical implementation of x-ray line
profile analysis and serves as a reference source for engineers in
various disciplines as well as scholars and upper-level students.
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