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Yield and Variability Optimization of Integrated Circuits (Paperback, Softcover reprint of the original 1st ed. 1995)
Loot Price: R2,777
Discovery Miles 27 770
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Yield and Variability Optimization of Integrated Circuits (Paperback, Softcover reprint of the original 1st ed. 1995)
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Traditionally, Computer Aided Design (CAD) tools have been used to
create the nominal design of an integrated circuit (IC), such that
the circuit nominal response meets the desired performance
specifications. In reality, however, due to the disturbances ofthe
IC manufacturing process, the actual performancesof the mass
produced chips are different than those for the nominal design.
Even if the manufacturing process were tightly controlled, so that
there were little variations across the chips manufactured, the
environmentalchanges (e. g. those oftemperature, supply voltages,
etc. ) would alsomakethe circuit performances vary during the
circuit life span. Process-related performance variations may lead
to low manufacturing yield, and unacceptable product quality. For
these reasons, statistical circuit design techniques are required
to design the circuit parameters, taking the statistical process
variations into account. This book deals with some theoretical and
practical aspects of IC statistical design, and emphasizes how they
differ from those for discrete circuits. It de scribes a spectrum
of different statistical design problems, such as parametric yield
optimization, generalized on-target design, variability
minimization, per formance tunning, and worst-case design. The main
emphasis of the presen tation is placed on the principles and
practical solutions for performance vari ability minimization. It
is hoped that the book may serve as an introductory reference
material for various groups of IC designers, and the methodologies
described will help them enhance the circuit quality and
manufacturability. The book containsseven chapters.
General
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