The chapters in this edited book are written by some authors who
have presented very high quality papers at the 2015 International
Symposium of Next-Generation Electronics (ISNE 2015) held in
Taipei, Taiwan. The ISNE 2015 was intended to provide a common
forum for researchers, scientists, engineers, and practitioners
throughout the world to present their latest research findings,
ideas, developments, and applications in the general areas of
electron devices, integrated circuits, and microelectronic systems
and technologies. The scope of the conference includes the
following topics: A. Green Electronics B. Microelectronic Circuits
and Systems C. Integrated Circuits and Packaging Technologies D.
Computer and Communication Engineering E. Electron Devices F.
Optoelectronic and Semiconductor Technologies The technical program
consisted of 4 plenary talks, 23 invited talks, and more than 250
contributed oral and poster presentations. Plenary speakers were
recognized experts in their fields, and their talks focused on
leading-edge technologies including: "The Future Lithographic
Technology for Semiconductor Fabrication" by Dr. Alek C. Chen, Asia
ASML, Taiwan. "Detection of Single Traps and Characterization of
Individual Traps: Beginning of Atomistic Reliability Physics" by
Prof. Toshiaki Tsuchiya, Shimane University, Japan. "The Art and
Science of Packaging High-Coupling Photonics Devices and Modules",
by Prof. Wood-Hi Cheng, National Chung-Hsing University, Taiwan.
"Prospect and Outlook of Electrostatic Discharge (ESD) Protection
in Emerging Technologies", by Prof. Juin J. Liou, University of
Central Florida, USA. After a rigorous review process, the ISNE
2015 technical program committee has selected 10 outstanding
presentations and invited the authors to prepare extended chapters
for inclusion in this edited book. Of the 10 chapters, five are
focused on the subject of electronic devices, and the other covers
the circuit designs for various applications. The authors are
working at the academia in Austria, United States, Korea, and
Taiwan. The guest editors would like to take this opportunity to
express our sincere gratitude to all the members of the ISNE 2015
technical program committees for reviewing the papers and selecting
the manuscripts for the edited book. We also thank all the authors
for their valuable and excellent contributions to the book.
General
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