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Unified Methods for VLSI Simulation and Test Generation (Hardcover, 1989 ed.) Loot Price: R3,115
Discovery Miles 31 150
Unified Methods for VLSI Simulation and Test Generation (Hardcover, 1989 ed.): Kwang-Ting (Tim) Cheng, Vishwani D. Agrawal

Unified Methods for VLSI Simulation and Test Generation (Hardcover, 1989 ed.)

Kwang-Ting (Tim) Cheng, Vishwani D. Agrawal

Series: The Springer International Series in Engineering and Computer Science, 73

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Loot Price R3,115 Discovery Miles 31 150 | Repayment Terms: R292 pm x 12*

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General

Imprint: Springer
Country of origin: Netherlands
Series: The Springer International Series in Engineering and Computer Science, 73
Release date: June 1989
First published: 1989
Authors: Kwang-Ting (Tim) Cheng • Vishwani D. Agrawal
Dimensions: 234 x 156 x 11mm (L x W x T)
Format: Hardcover
Pages: 148
Edition: 1989 ed.
ISBN-13: 978-0-7923-9025-1
Categories: Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > General
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LSN: 0-7923-9025-3
Barcode: 9780792390251

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