Power-Aware Testing and Test Strategies for Low Power Devices (Paperback, 2010 ed.)

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	September 2014
First published:	2010
Editors:	Patrick Girard • Nicola Nicolici • Xiaoqing Wen
Dimensions:	235 x 155 x 20mm (L x W x T)
Format:	Paperback
Pages:	363
Edition:	2010 ed.
ISBN-13:	978-1-4899-8313-8
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN:	1-4899-8313-9
Barcode:	9781489983138

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