Random Testing of Digital Circuits - Theory and Applications (Hardcover)

This well-organized reference/text introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers, design for random testability, and testing results. Contains several new and unpublished results The fruit of two decades' research by the author, Random Testing of Digital Circuits calculates random test lengths for combinational and sequential circuits, memory circuits, and microprocessors provides experimental results derived from real circuits, not simulations illustrates the efficiency of random testing for nontarget faults explores performance measurements and design for random pattern testing profiles both single and multiple input signature analyzers describes testing procedures for complex sequential machines examines results from TTL circuits, LSI CMOS circuits, and the Motorola 6800 microprocessor highlights both software and hardware generation of random test sequences and more Random Testing of Digital Circuits serves as an excellent reference for electrical and electronics, circuit test, circuit design, communications, component, and control engineers; applied mathematicians and statisticians; computer scientists; and an outstanding text for upper-level undergraduate and graduate students in these disciplines.

General

Imprint:	Crc Press
Country of origin:	United States
Release date:	April 1998
First published:	April 1998
Authors:	Rene David
Dimensions:	229 x 152 x 29mm (L x W x T)
Format:	Hardcover
Pages:	496
ISBN-13:	978-0-8247-0182-6
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN:	0-8247-0182-8
Barcode:	9780824701826

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