Books > Professional & Technical > Mechanical engineering & materials > Materials science
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Electrically Based Microstructural Characterization III: Volume 699 (Paperback)
Loot Price: R1,000
Discovery Miles 10 000
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Electrically Based Microstructural Characterization III: Volume 699 (Paperback)
Series: MRS Proceedings
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This book, first published in 2002, focuses on the application of
electrical measurements as a nondestructive tool for
microstructural characterization. Papers show how the usage of dc-
and ac- resistivity measurements, complex impedance analysis,
ellipsometry, and capacitance-voltage measurements are used to
assess phase transformations, presence of grain boundary layers
with different electrical response, anisotropy, mechanical
degradation, and presence of defects and porosity in a wide range
of materials and devices. The development of scanning impedance
imaging by applying a lateral bias to an AFM specimen opens up many
opportunities for simultaneous electrical property and
microstructural data acquisition. This is the first time that
impedance spectroscopy has been used to characterize metallic
alloys in the metallic state, in the absence of liquid
electrolytes. Papers focus on characterizing components in various
microelectronic devices, with an emphasis on materials
interpretation rather than device interpretation. The description
of a new method of analysis for magnetic materials also deserves
mention. Topics include: electrically inhomogeneous materials;
advances in experimental methods and interpretation;
microelectronic applications; metals and alloys and amorphous
materials.
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