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Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design
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Long-Term Reliability of Nanometer VLSI Systems - Modeling, Analysis and Optimization (Hardcover, 1st ed. 2019)
Loot Price: R4,668
Discovery Miles 46 680
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Long-Term Reliability of Nanometer VLSI Systems - Modeling, Analysis and Optimization (Hardcover, 1st ed. 2019)
Expected to ship within 10 - 15 working days
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This book provides readers with a detailed reference regarding two
of the most important long-term reliability and aging effects on
nanometer integrated systems, electromigrations (EM) for
interconnect and biased temperature instability (BTI) for CMOS
devices. The authors discuss in detail recent developments in the
modeling, analysis and optimization of the reliability effects from
EM and BTI induced failures at the circuit, architecture and system
levels of abstraction. Readers will benefit from a focus on topics
such as recently developed, physics-based EM modeling, EM modeling
for multi-segment wires, new EM-aware power grid analysis, and
system level EM-induced reliability optimization and management
techniques. Reviews classic Electromigration (EM) models, as well
as existing EM failure models and discusses the limitations of
those models; Introduces a dynamic EM model to address transient
stress evolution, in which wires are stressed under time-varying
current flows, and the EM recovery effects. Also includes new,
parameterized equivalent DC current based EM models to address the
recovery and transient effects; Presents a cross-layer approach to
transistor aging modeling, analysis and mitigation, spanning
multiple abstraction levels; Equips readers for EM-induced dynamic
reliability management and energy or lifetime optimization
techniques, for many-core dark silicon microprocessors, embedded
systems, lower power many-core processors and datacenters.
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