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Books > Computing & IT > Computer hardware & operating systems > Computer architecture & logic design
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Design, Analysis and Test of Logic Circuits Under Uncertainty (Hardcover, 2012)
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Design, Analysis and Test of Logic Circuits Under Uncertainty (Hardcover, 2012)
Series: Lecture Notes in Electrical Engineering, 115
Expected to ship within 12 - 17 working days
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Logic circuits are becoming increasingly susceptible to
probabilistic behavior caused by external radiation and process
variation. In addition, inherently probabilistic quantum- and
nano-technologies are on the horizon as we approach the limits of
CMOS scaling. Ensuring the reliability of such circuits despite the
probabilistic behavior is a key challenge in IC design---one that
necessitates a fundamental, probabilistic reformulation of
synthesis and testing techniques. This monograph will present
techniques for analyzing, designing, and testing logic circuits
with probabilistic behavior.
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