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VLSI Design for Manufacturing: Yield Enhancement (Paperback, Softcover reprint of the original 1st ed. 1990) Loot Price: R4,445
Discovery Miles 44 450
VLSI Design for Manufacturing: Yield Enhancement (Paperback, Softcover reprint of the original 1st ed. 1990): Stephen W....

VLSI Design for Manufacturing: Yield Enhancement (Paperback, Softcover reprint of the original 1st ed. 1990)

Stephen W. Director, Wojciech Maly, Andrzej J. Strojwas

Series: The Springer International Series in Engineering and Computer Science, 86

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Loot Price R4,445 Discovery Miles 44 450 | Repayment Terms: R417 pm x 12*

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One of the keys to success in the IC industry is getting a new product to market in a timely fashion and being able to produce that product with sufficient yield to be profitable. There are two ways to increase yield: by improving the control of the manufacturing process and by designing the process and the circuits in such a way as to minimize the effect of the inherent variations of the process on performance. The latter is typically referred to as "design for manufacture" or "statistical design." As device sizes continue to shrink, the effects of the inherent fluctuations in the IC fabrication process will have an even more obvious effect on circuit performance. And design for manufacture will increase in importance. We have been working in the area of statistically based computer aided design for more than 13 years. During the last decade we have been working with each other, and individually with our students, to develop methods and CAD tools that can be used to improve yield during the design and manufacturing phases of IC realization. This effort has resulted in a large number of publications that have appeared in a variety of journals and conference proceedings. Thus our motivation in writing this book is to put, in one place, a description of our approach to IC yield enhancement. While the work that is contained in this book has appeared in the open literature, we have attempted to use a consistent notation throughout this book.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: The Springer International Series in Engineering and Computer Science, 86
Release date: September 2011
First published: 1990
Authors: Stephen W. Director • Wojciech Maly • Andrzej J. Strojwas
Dimensions: 235 x 155 x 17mm (L x W x T)
Format: Paperback
Pages: 292
Edition: Softcover reprint of the original 1st ed. 1990
ISBN-13: 978-1-4612-8816-9
Categories: Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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LSN: 1-4612-8816-9
Barcode: 9781461288169

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