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Investigation of Gate Current In Neutron Irradiated AlxGa1-xN/GaN Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence (Paperback) Loot Price: R1,399
Discovery Miles 13 990
Investigation of Gate Current In Neutron Irradiated AlxGa1-xN/GaN Heterogeneous Field Effect Transistors Using Voltage and...

Investigation of Gate Current In Neutron Irradiated AlxGa1-xN/GaN Heterogeneous Field Effect Transistors Using Voltage and Temperature Dependence (Paperback)

Thomas E. Gray

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Loot Price R1,399 Discovery Miles 13 990 | Repayment Terms: R131 pm x 12*

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The gate current of Al27Ga73N/GaN heterogeneous field effect transistors (HFETs) is investigated using current-voltage (IV) and current-temperature (IT) measurement demonstrating that trap assisted tunneling (TAT) is the primary current mechanism. Excellent fit to experimental data is achieved using a thermionic trap assisted tunneling (TTT) model. A single value for each of the primary parameters (Schottky barrier height, trap energy, donor density and trap density) results in a sigma of 1.38x10-8 A for IT data measured at five voltages between 85K and 290K and for IV data measured at three temperatures between 0.0 V and -4.0 V. High energy (gt;0.5 MeV) neutron irradiation at fluences between 4.0x1010 and 1.2x1012 n/cm2 confirms an increase of gate current with fluence. A change in IV characteristics, interpreted as an increase in magnitude of threshold voltage, is also observed.

General

Imprint: Biblioscholar
Country of origin: United States
Release date: November 2012
First published: November 2012
Authors: Thomas E. Gray
Dimensions: 246 x 189 x 7mm (L x W x T)
Format: Paperback - Trade
Pages: 128
ISBN-13: 978-1-288-30834-7
Categories: Books > Social sciences > Education > General
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LSN: 1-288-30834-5
Barcode: 9781288308347

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