This book systematically examines the results of an investigation
of electronic and molecular processes on the surface of
semiconductors, taking place at their interaction with particles of
a gas environment or in the course of superficial alloying by atoms
of metals. The main subject of the book is the analysis of
interaction of semiconductors with foreign atoms and molecules from
a gas environment and from beams of elements, bombarding a surface.
This book consists of five chapters, including 13 tables, 122
figures and bibliography based on over 500 sources, including
author's publications and data originally never published in
English before. The book acquaints the reader with basic concepts
and positions, used at the description of interaction of
semiconductor surface with foreign atoms and molecules.
Demonstration of opportunities arising from the usage of local and
collective approaches to the analysis of electronic and molecular
processes on a surface is useful though insufficient in determining
the sensitivity for adsorption of a semiconductors' surface.
General
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