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This is a comprehensive guide to fault injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different fault injection techniques and tools are authored by key scientists in the field of system dependability and fault tolerance.
Our society is faced with an increasing dependence on computing
systems, not only in high tech consumer applications but also in
areas (e.g., air and railway traffic control, nuclear plant
control, aircraft and car control) where a failure can be critical
for the safety of human beings. Unfortunately, it is accepted that
large digital systems cannot be fault-free. Some faults may be
attributed to inaccuracy during the development, while others can
come from external causes such as environmental stress. Radiations,
electromagnetic interference and power glitches are some of the
most common causes of transient faults.
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