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Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation (Paperback, Softcover reprint of the original 1st ed. 2003) Loot Price: R4,001
Discovery Miles 40 010
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation (Paperback, Softcover reprint of the original...

Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation (Paperback, Softcover reprint of the original 1st ed. 2003)

Alfredo Benso, Paolo Prinetto

Series: Frontiers in Electronic Testing, 23

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Loot Price R4,001 Discovery Miles 40 010 | Repayment Terms: R375 pm x 12*

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Our society is faced with an increasing dependence on computing systems, not only in high tech consumer applications but also in areas (e.g., air and railway traffic control, nuclear plant control, aircraft and car control) where a failure can be critical for the safety of human beings. Unfortunately, it is accepted that large digital systems cannot be fault-free. Some faults may be attributed to inaccuracy during the development, while others can come from external causes such as environmental stress. Radiations, electromagnetic interference and power glitches are some of the most common causes of transient faults.
As a consequence, the past years have seen a growing interest in methods for studying the behaviour of computer-based systems when faults occur, and several approaches have been proposed to evaluate the dependability properties of a computer-based system.
Fault Injection, i.e., the artificial injection of faults into a computer system in order to study its behaviour, emerged as a viable solution, and has been deeply investigated by both academia and industry. Different techniques have been proposed and some of them practically experimented.
Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation intends to be a comprehensive guide to Fault Injection techniques used to evaluate the dependability of a digital system. The description and the critical analysis of different Fault Injection techniques and tools will be authored by key scientists in the field of system dependability and fault tolerance.

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Frontiers in Electronic Testing, 23
Release date: December 2010
First published: 2003
Editors: Alfredo Benso • Paolo Prinetto
Dimensions: 235 x 155 x 13mm (L x W x T)
Format: Paperback
Pages: 241
Edition: Softcover reprint of the original 1st ed. 2003
ISBN-13: 978-1-4419-5391-9
Categories: Books > Professional & Technical > Technology: general issues > Engineering: general
Books > Reference & Interdisciplinary > Communication studies > Information theory > Cybernetics & systems theory
Books > Professional & Technical > Technology: general issues > Technical design > Computer aided design (CAD)
Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
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LSN: 1-4419-5391-4
Barcode: 9781441953919

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