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The Advanced Study Institute provided an opportunity for
researchers in universities, industry and National and
International Laboratories, from the disciplines ofmaterials
science, physics, chemistry and engineering to meet together in an
assessment of the impact of electron and scanning probe microscopy
on advanced material research. Since these researchers have
traditionally relied upon different approaches, due to their
different scientific background, to advanced materials problem
solving, presentations and discussion within the Institute sessions
were initially devoted to developing a set ofmutually understood
basic concepts, inherently related to different techniques
ofcharacterization by microscopy and spectroscopy. Particular
importance was placed on Electron Energy Loss Spectroscopy (EELS),
Scanning Probe Microscopy (SPM), High Resolution Transmission and
Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental
Scanning Electron Microscopy (ESEM). It was recognized that the
electronic structure derived directly from EELS analysis as well as
from atomic positions in HRTEM or High Angle Annular Dark Field
STEM can be used to understand the macroscopic behaviour of
materials. The emphasis, however, was upon the analysis of the
electronic band structure of grain boundaries, fundamental for the
understanding of macroscopic quantities such as strength, cohesion,
plasticity, etc.
The Advanced Study Institute provided an opportunity for
researchers in universities, industry and National and
International Laboratories, from the disciplines ofmaterials
science, physics, chemistry and engineering to meet together in an
assessment of the impact of electron and scanning probe microscopy
on advanced material research. Since these researchers have
traditionally relied upon different approaches, due to their
different scientific background, to advanced materials problem
solving, presentations and discussion within the Institute sessions
were initially devoted to developing a set ofmutually understood
basic concepts, inherently related to different techniques
ofcharacterization by microscopy and spectroscopy. Particular
importance was placed on Electron Energy Loss Spectroscopy (EELS),
Scanning Probe Microscopy (SPM), High Resolution Transmission and
Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental
Scanning Electron Microscopy (ESEM). It was recognized that the
electronic structure derived directly from EELS analysis as well as
from atomic positions in HRTEM or High Angle Annular Dark Field
STEM can be used to understand the macroscopic behaviour of
materials. The emphasis, however, was upon the analysis of the
electronic band structure of grain boundaries, fundamental for the
understanding of macroscopic quantities such as strength, cohesion,
plasticity, etc.
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