0
Your cart

Your cart is empty

Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > Non-destructive testing

Buy Now

Impact of Electron and Scanning Probe Microscopy on Materials Research (Paperback, Softcover reprint of the original 1st ed. 1999) Loot Price: R3,154
Discovery Miles 31 540
Impact of Electron and Scanning Probe Microscopy on Materials Research (Paperback, Softcover reprint of the original 1st ed....

Impact of Electron and Scanning Probe Microscopy on Materials Research (Paperback, Softcover reprint of the original 1st ed. 1999)

David G. Rickerby, Giovanni Valdre, Ugo Valdre

Series: NATO Science Series E:, 364

 (sign in to rate)
Loot Price R3,154 Discovery Miles 31 540 | Repayment Terms: R296 pm x 12*

Bookmark and Share

Expected to ship within 10 - 15 working days

The Advanced Study Institute provided an opportunity for researchers in universities, industry and National and International Laboratories, from the disciplines ofmaterials science, physics, chemistry and engineering to meet together in an assessment of the impact of electron and scanning probe microscopy on advanced material research. Since these researchers have traditionally relied upon different approaches, due to their different scientific background, to advanced materials problem solving, presentations and discussion within the Institute sessions were initially devoted to developing a set ofmutually understood basic concepts, inherently related to different techniques ofcharacterization by microscopy and spectroscopy. Particular importance was placed on Electron Energy Loss Spectroscopy (EELS), Scanning Probe Microscopy (SPM), High Resolution Transmission and Scanning Electron Microscopy (HRTEM, HRSTEM) and Environmental Scanning Electron Microscopy (ESEM). It was recognized that the electronic structure derived directly from EELS analysis as well as from atomic positions in HRTEM or High Angle Annular Dark Field STEM can be used to understand the macroscopic behaviour of materials. The emphasis, however, was upon the analysis of the electronic band structure of grain boundaries, fundamental for the understanding of macroscopic quantities such as strength, cohesion, plasticity, etc.

General

Imprint: Springer
Country of origin: Netherlands
Series: NATO Science Series E:, 364
Release date: September 1999
First published: 1999
Editors: David G. Rickerby • Giovanni Valdre • Ugo Valdre
Dimensions: 240 x 160 x 26mm (L x W x T)
Format: Paperback
Pages: 489
Edition: Softcover reprint of the original 1st ed. 1999
ISBN-13: 978-0-7923-5940-1
Categories: Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > Non-destructive testing
Promotions
LSN: 0-7923-5940-2
Barcode: 9780792359401

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

You might also like..

Non-Destructive Evaluation (NDE) of…
V. M. Karbhari Hardcover R5,797 Discovery Miles 57 970
The Wear Debris Analysis Handbook
Trevor M. Hunt, Brian J. Roylance Hardcover R1,564 Discovery Miles 15 640
Atlas of Material Damage
George Wypych Hardcover R6,138 Discovery Miles 61 380
Materials Characterization Using…
Gerhard Huebschen, Iris Altpeter, … Hardcover R4,648 R4,295 Discovery Miles 42 950
Electromagnetic Nondestructive…
Gerd Dobmann Hardcover R2,801 Discovery Miles 28 010
Advanced Electromagnetic Models for…
Harold A. Sabbagh, R. Kim Murphy, … Hardcover R4,486 Discovery Miles 44 860
Theory and Practice of Infrared…
X.P.V. Maldague Hardcover R5,766 Discovery Miles 57 660
Non-destructive Testing and Repair of…
Evgeny N. Barkanov, Ivan A. Parinov Hardcover R5,061 Discovery Miles 50 610
Structural and Residual Stress Analysis…
V. Hauk Hardcover R9,447 Discovery Miles 94 470
Digital Hardware Testing…
Rochit Rajsuman Hardcover R3,579 Discovery Miles 35 790
Advances in Signal Processing for…
Xavier P.V. Maldague Hardcover R2,649 Discovery Miles 26 490
Non-destructive Testing Techniques
Ravi Prakash Hardcover R889 Discovery Miles 8 890

See more

Partners