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Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > Non-destructive testing

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Digital Hardware Testing - Transistor-level Fault Modeling and Testing (Hardcover) Loot Price: R3,509
Discovery Miles 35 090
Repayment Terms: R329 pm x 12*
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Digital Hardware Testing - Transistor-level Fault Modeling and Testing (Hardcover): Rochit Rajsuman

Digital Hardware Testing - Transistor-level Fault Modeling and Testing (Hardcover)

Rochit Rajsuman

Series: Materials Library S.

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Loot Price R3,509 Discovery Miles 35 090 | Repayment Terms: R329 pm x 12*

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Digital Hardware Testing presents realistic transistor-level fault models and testing methods for all types of circuits. The discussion details design-for-testability and built-in self-test methods, with coverage of boundary scan and emerging technologies such as partial scan, cross check, and circular self-test-path.

General

Imprint: Artech House Publishers
Country of origin: United States
Series: Materials Library S.
Release date: December 1992
First published: December 1992
Authors: Rochit Rajsuman
Dimensions: 229 x 152 x 22mm (L x W x T)
Format: Hardcover - Laminated cover
Pages: 340
ISBN-13: 978-0-89006-580-8
Categories: Books > Computing & IT > Computer hardware & operating systems > Storage media & peripherals
Books > Professional & Technical > Mechanical engineering & materials > Production engineering > Reliability engineering
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > Non-destructive testing
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LSN: 0-89006-580-2
Barcode: 9780890065808

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