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Radiation Damage in Materials - Helium Effects (Hardcover): Yongqiang Wang, Khalid Hattar Radiation Damage in Materials - Helium Effects (Hardcover)
Yongqiang Wang, Khalid Hattar
R1,089 Discovery Miles 10 890 Ships in 12 - 17 working days
Ion Beam Analysis - Fundamentals and Applications (Paperback): Michael Nastasi, James W. Mayer, Yongqiang Wang Ion Beam Analysis - Fundamentals and Applications (Paperback)
Michael Nastasi, James W. Mayer, Yongqiang Wang
R1,847 Discovery Miles 18 470 Ships in 12 - 17 working days

Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. The book explains how ions interact with solids and describes what information can be gained. It starts by covering the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induced x-ray emission, and nuclear reaction analysis. The second part turns to applications, looking at the broad range of potential uses in thin film reactions, ion implantation, nuclear energy, biology, and art/archaeology. Examines classical collision theory Details the fundamentals of five specific ion beam analysis techniques Illustrates specific applications, including biomedicine and thin film analysis Provides examples of ion beam analysis in traditional and emerging research fields Supplying readers with the means to understand the benefits and limitations of IBA, the book offers practical information that users can immediately apply to their own work. It covers the broad range of current and emerging applications in materials science, physics, art, archaeology, and biology. It also includes a chapter on computer applications of IBA.

Ion Beam Analysis - Fundamentals and Applications (Hardcover): Michael Nastasi, James W. Mayer, Yongqiang Wang Ion Beam Analysis - Fundamentals and Applications (Hardcover)
Michael Nastasi, James W. Mayer, Yongqiang Wang
R5,025 Discovery Miles 50 250 Ships in 12 - 17 working days

Ion Beam Analysis: Fundamentals and Applications explains the basic characteristics of ion beams as applied to the analysis of materials, as well as ion beam analysis (IBA) of art/archaeological objects. It focuses on the fundamentals and applications of ion beam methods of materials characterization. The book explains how ions interact with solids and describes what information can be gained. It starts by covering the fundamentals of ion beam analysis, including kinematics, ion stopping, Rutherford backscattering, channeling, elastic recoil detection, particle induced x-ray emission, and nuclear reaction analysis. The second part turns to applications, looking at the broad range of potential uses in thin film reactions, ion implantation, nuclear energy, biology, and art/archaeology. Examines classical collision theory Details the fundamentals of five specific ion beam analysis techniques Illustrates specific applications, including biomedicine and thin film analysis Provides examples of ion beam analysis in traditional and emerging research fields Supplying readers with the means to understand the benefits and limitations of IBA, the book offers practical information that users can immediately apply to their own work. It covers the broad range of current and emerging applications in materials science, physics, art, archaeology, and biology. It also includes a chapter on computer applications of IBA.

Handbook of Modern Ion Beam Materials Analysis (Hardcover, 2nd Revised edition): Yongqiang Wang, Michael Nastasi Handbook of Modern Ion Beam Materials Analysis (Hardcover, 2nd Revised edition)
Yongqiang Wang, Michael Nastasi
R2,440 Discovery Miles 24 400 Ships in 12 - 17 working days

The Handbook of Modern Ion Beam Materials Analysis, Second Edition is a compilation of updated techniques and data for use in the ion-beam analysis of materials. The information presented is unavailable collectively from any other source, and places a strong emphasis on practical examples of the analysis techniques as they are applied to common problems. Revised and updated from the popular handbook previously released in 1995, this edition is written and compiled by over 30 leading authorities in the field of ion beam analysis and is an important reference tool for technicians, students and professionals. It is an excellent introduction to the fundamentals and lab practices of ion beam analysis and useful as a teaching text for undergraduate senior or first-year graduate students. It is the most recent and comprehensive collection of nuclear and atomic data for the applications of ion beam materials analysis.

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