VLSI Design and Test - 23rd International Symposium, VDAT 2019, Indore, India, July 4-6, 2019, Revised Selected Papers (Paperback, 1st ed. 2019)

This book constitutes the refereed proceedings of the 23st International Symposium on VLSI Design and Test, VDAT 2019, held in Indore, India, in July 2019. The 63 full papers were carefully reviewed and selected from 199 submissions. The papers are organized in topical sections named: analog and mixed signal design; computing architecture and security; hardware design and optimization; low power VLSI and memory design; device modelling; and hardware implementation.

General

Imprint:	Springer Verlag, Singapore
Country of origin:	Singapore
Series:	Communications in Computer and Information Science, 1066
Release date:	August 2019
First published:	2019
Editors:	Anirban Sengupta • Sudeb Dasgupta • Virendra Singh • Rohit Sharma • Santosh Kumar Vishvakarma
Dimensions:	235 x 155mm (L x W)
Format:	Paperback
Pages:	775
Edition:	1st ed. 2019
ISBN-13:	978-981-3297-66-1
Categories:	Books > Computing & IT > General theory of computing > Mathematical theory of computation Books > Computing & IT > Computer hardware & operating systems > General Books > Computing & IT > Computer communications & networking > Network security Books > Computing & IT > Applications of computing > Artificial intelligence > General Books > Computing & IT > Applications of computing > Image processing > General
LSN:	981-3297-66-2
Barcode:	9789813297661

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