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Fault-Tolerance Techniques for SRAM-Based FPGAs (Hardcover, 2006 ed.)
Loot Price: R2,842
Discovery Miles 28 420
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Fault-Tolerance Techniques for SRAM-Based FPGAs (Hardcover, 2006 ed.)
Series: Frontiers in Electronic Testing, 32
Expected to ship within 10 - 15 working days
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Fault-tolerance in integrated circuits is not an exclusive concern
regarding space designers or highly-reliable application engineers.
Rather, designers of next generation products must cope with
reduced margin noises due to technological advances. The continuous
evolution of the fabrication technology process of semiconductor
components, in terms of transistor geometry shrinking, power
supply, speed, and logic density, has significantly reduced the
reliability of very deep submicron integrated circuits, in face of
the various internal and external sources of noise. The very
popular Field Programmable Gate Arrays, customizable by SRAM cells,
are a consequence of the integrated circuit evolution with millions
of memory cells to implement the logic, embedded memories, routing,
and more recently with embedded microprocessors cores. These
re-programmable systems-on-chip platforms must be fault-tolerant to
cope with present days requirements. This book discusses
fault-tolerance techniques for SRAM-based Field Programmable Gate
Arrays (FPGAs). It starts by showing the model of the problem and
the upset effects in the programmable architecture. to protect
integrated circuits against errors. A large set of methods for
designing fault tolerance systems in SRAM-based FPGAs is described.
Some presented techniques are based on developing a new
fault-tolerant architecture with new robustness FPGA elements.
Other techniques are based on protecting the high-level hardware
description before the synthesis in the FPGA. The reader has the
flexibility of choosing the most suitable fault-tolerance technique
for its project and to compare a set of fault tolerant techniques
for programmable logic applications.
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