Digital Circuit Testing - A Guide to DFT and Other Techniques (Hardcover)

Recent technological advances have created a "testing crisis" in the elctronics industry - smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods,. Some of the techniques now becoming popular include "design for testability" (DFT), "built-in self-test" (BIST), and "automatic test vector generation" (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples, so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.

General

Imprint:	Academic Press Inc
Country of origin:	United States
Release date:	August 1991
First published:	August 1991
Authors:	Francis C. Wang
Dimensions:	235 x 159 x 17mm (L x W x T)
Format:	Hardcover
Pages:	228
ISBN-13:	978-0-12-734580-2
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General Books > Academic & Education > Professional & Technical > Electronics Promotions
LSN:	0-12-734580-9
Barcode:	9780127345802

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