Advanced Mathematical And Computational Tools In Metrology And Testing Ix (Hardcover)

This volume contains original, refereed worldwide contributions. They were prompted by presentations made at the ninth AMCTM Conference held in G teborg (Sweden) in June 2011 on the theme of advanced mathematical and computational tools in metrology and also, in the title of this book series, in testing. The themes in this volume reflect the importance of the mathematical, statistical and numerical tools and techniques in metrology and testing and, also in keeping the challenge promoted by the Metre Convention, to access a mutual recognition for the measurement standards.

General

Imprint:	World Scientific Publishing Co Pte Ltd
Country of origin:	Singapore
Series:	Series on Advances in Mathematics for Applied Sciences, 84
Release date:	March 2012
First published:	March 2012
Editors:	Franco Pavese • Markus Baer • Jean-Remy Filtz • Alistair B. Forbes • Leslie Pendrill • Kastsuhiro Shirono
Dimensions:	229 x 157 x 28mm (L x W x T)
Format:	Hardcover - Cloth over boards
Pages:	468
ISBN-13:	978-981-4397-94-0
Categories:	Books > Science & Mathematics > Science: general issues > Scientific standards
LSN:	981-4397-94-6
Barcode:	9789814397940

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