Functional Design Errors in Digital Circuits Diagnosis covers a
wide spectrum of innovative methods to automate the debugging
process throughout the design flow: from Register-Transfer Level
(RTL) all the way to the silicon die. In particular, this book
describes: (1) techniques for bug trace minimization that simplify
debugging; (2) an RTL error diagnosis method that identifies the
root cause of errors directly; (3) a counterexample-guided
error-repair framework to automatically fix errors in gate-level
and RTL designs; (4) a symmetry-based rewiring technology for
fixing electrical errors; (5) an incremental verification system
for physical synthesis; and (6) an integrated framework for
post-silicon debugging and layout repair. The solutions provided in
this book can greatly reduce debugging effort, enhance design
quality, and ultimately enable the design and manufacture of more
reliable electronic devices.
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