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Advances in Imaging and Electron Physics, Volume 149 - Electron Emission Physics (Hardcover, 149th edition) Loot Price: R6,247

Discovery Miles 62 470

Repayment Terms: R585 pm x 12*

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Advances in Imaging and Electron Physics, Volume 149 - Electron Emission Physics (Hardcover, 149th edition): Kevin Jensen

Advances in Imaging and Electron Physics, Volume 149 - Electron Emission Physics (Hardcover, 149th edition)

Kevin Jensen; Series edited by Peter W. Hawkes

Series: Advances in Imaging and Electron Physics

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Loot Price R6,247 Discovery Miles 62 470 | Repayment Terms: R585 pm x 12*

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"Advances in Imaging and Electron Physics" merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
This thematic volume is on the topic of "Field-emission Source Mechanisms" and is authored by Kevin Jensen, Naval Research Laboratory, Washington, DC.

General

Imprint:	Academic Press Inc
Country of origin:	United States
Series:	Advances in Imaging and Electron Physics
Release date:	December 2007
First published:	November 2007
Authors:	Kevin Jensen
Series editors:	Peter W. Hawkes
Dimensions:	229 x 152 x 22mm (L x W x T)
Format:	Hardcover
Pages:	360
Edition:	149th edition
ISBN-13:	978-0-12-374207-0
Categories:	Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Applied optics > General Promotions
LSN:	0-12-374207-2
Barcode:	9780123742070