This volume dedicated to William Q. Meeker on the occasion of
his sixtieth birthday is a collection of invited chapters covering
recent advances in accelerated life testing and degradation models.
The book covers a wide range of applications to areas such as
reliability, quality control, the health sciences, economics and
finance. Additional topics covered include accelerated testing and
inference, step-stress testing and inference, nonparametric
inference, model validity in accelerated testing, the point process
approach, bootstrap methods in degradation analysis, exact
inferential methods in reliability, dynamic perturbed systems, and
degradation models in statistics. Advances in Degradation Modeling
is an excellent reference for researchers and practitioners in
applied probability and statistics, industrial statistics, the
health sciences, quality control, economics, and finance.
General
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