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Current Challenges in Patent Information Retrieval (Paperback, Softcover reprint of the original 2nd ed. 2017)
Loot Price: R2,980
Discovery Miles 29 800
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Current Challenges in Patent Information Retrieval (Paperback, Softcover reprint of the original 2nd ed. 2017)
Series: The Information Retrieval Series, 37
Expected to ship within 10 - 15 working days
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This second edition provides a systematic introduction to the work
and views of the emerging patent-search research and innovation
communities as well as an overview of what has been achieved and,
perhaps even more importantly, of what remains to be achieved. It
revises many of the contributions of the first edition and adds a
significant number of new ones. The first part "Introduction to
Patent Searching" includes two overview chapters on the
peculiarities of patent searching and on contemporary search
technology respectively, and thus sets the scene for the subsequent
parts. The second part on "Evaluating Patent Retrieval" then begins
with two chapters dedicated to patent evaluation campaigns,
followed by two chapters discussing complementary issues from the
perspective of patent searchers and from the perspective of related
domains, notably legal search. "High Recall Search" includes four
completely new chapters dealing with the issue of finding only the
relevant documents in a reasonable time span. The last (and with
six papers the largest) part on "Special Topics in Patent
Information Retrieval" covers a large spectrum of research in the
patent field, from classification and image processing to
translation. Lastly, the book is completed by an outlook on open
issues and future research. Several of the chapters have been
jointly written by intellectual property and information retrieval
experts. However, members of both communities with a background
different to that of the primary author have reviewed the chapters,
making the book accessible to both the patent search community and
to the information retrieval research community. It also not only
offers the latest findings for academic researchers, but is also a
valuable resource for IP professionals wanting to learn about
current IR approaches in the patent domain.
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