Nanometer Variation-Tolerant SRAM - Circuits and Statistical Design for Yield (Hardcover, 2013)

Variability is one of the most challenging obstacles for IC design in the nanometer regime. In nanometer technologies, SRAM show an increased sensitivity to process variations due to low-voltage operation requirements, which are aggravated by the strong demand for lower power consumption and cost, while achieving higher performance and density. With the drastic increase in memory densities, lower supply voltages, and higher variations, statistical simulation methodologies become imperative to estimate memory yield and optimize performance and power. This book is an invaluable reference on robust SRAM circuits and statistical design methodologies for researchers and practicing engineers in the field of memory design. It combines state of the art circuit techniques and statistical methodologies to optimize SRAM performance and yield in nanometer technologies. Provides comprehensive review of state-of-the-art, variation-tolerant SRAM circuit techniques; Discusses Impact of device related process variations and how they affect circuit and system performance, from a design point of view; Helps designers optimize memory yield, with practical statistical design methodologies and yield estimation techniques.

General

Imprint:	Springer-Verlag New York
Country of origin:	United States
Release date:	September 2012
First published:	2013
Authors:	Mohamed Abu-Rahma • Mohab Anis
Dimensions:	235 x 155 x 15mm (L x W x T)
Format:	Hardcover
Pages:	172
Edition:	2013
ISBN-13:	978-1-4614-1748-4
Categories:	Books > Professional & Technical > Technology: general issues > Technical design > Computer aided design (CAD) Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN:	1-4614-1748-1
Barcode:	9781461417484

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