Thermal-Aware Testing of Digital VLSI Circuits and Systems (Paperback)

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips

General

Imprint:	Crc Press
Country of origin:	United Kingdom
Release date:	June 2020
First published:	2018
Authors:	Santanu Chattopadhyay
Dimensions:	216 x 138mm (L x W)
Format:	Paperback
Pages:	118
ISBN-13:	978-0-367-60709-8
Categories:	Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN:	0-367-60709-3
Barcode:	9780367607098

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