Thermal-Aware Testing of Digital VLSI Circuits and Systems (Hardcover)

This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level Describes range of algorithms for addressing thermal-aware test issue, presents comparison of temperature reduction with power-aware techniques and include results on benchmark circuits and systems for different techniques This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips

General

Imprint:	Crc Press
Country of origin:	United States
Release date:	April 2018
First published:	2018
Authors:	Santanu Chattopadhyay
Dimensions:	216 x 138 x 14mm (L x W x T)
Format:	Hardcover
Pages:	118
ISBN-13:	978-0-8153-7882-2
Categories:	Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
LSN:	0-8153-7882-3
Barcode:	9780815378822

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!