This monograph is concerned with the direct-scattering of
electromagnetic waves by one- and two-dimensional objects, and the
use of this technique in one-dimensional inverse profiling. It
discusses results of research into the method of this technique and
its application to specific problems.
Several techniques are presented for solving transient
electromagnetic direct-scattering problems. These problems are
solved indirectly, via a Fourier or Laplace transformation to the
real- or complex-frequency domain, as well as directly in the time
domain.
For the one-dimensional case it is described how the special
features of the respective techniques are also exploited to tackle
the inverse problem of determining obstacle properties from the
scattered field excited by a known incident field. The problems of
both identification and of inverse profiling are addressed.
For a range of specific problems representative numerical results
are presented and discussed. Particular attention is devoted to the
numerical implementation and to the physical interpretation of the
theoretical numerical results obtained. With respect to
inverse-scattering the emphasis is on the band-limiting effects
that may arise due to approximation errors in the various inversion
schemes employed.
General
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