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Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Electronic devices & materials > Semi-conductors & super-conductors
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Scanning Nonlinear Dielectric Microscopy - Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Paperback)
Loot Price: R3,877
Discovery Miles 38 770
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Scanning Nonlinear Dielectric Microscopy - Investigation of Ferroelectric, Dielectric, and Semiconductor Materials and Devices (Paperback)
Series: Woodhead Publishing Series in Electronic and Optical Materials
Expected to ship within 12 - 17 working days
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Scanning Nonlinear Dielectric Microscopy: Investigation of
Ferroelectric, Dielectric, and Semiconductor Materials and Devices
is the definitive reference on an important tool to characterize
ferroelectric, dielectric and semiconductor materials. Written by
the inventor, the book reviews the methods for applying the
technique to key materials applications, including the measurement
of ferroelectric materials at the atomic scale and the
visualization and measurement of semiconductor materials and
devices at a high level of sensitivity. Finally, the book reviews
new insights this technique has given to material and device
physics in ferroelectric and semiconductor materials. The book is
appropriate for those involved in the development of ferroelectric,
dielectric and semiconductor materials devices in academia and
industry.
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