Anomalous X-Ray Scattering for Materials Characterization - Atomic-Scale Structure Determination (Paperback, Softcover reprint of the original 1st ed. 2002)

The production of multi layered thin films with sufficient reliability is a key technology for device fabrication in micro electronics. In the Co/Cu type multi layers, for example, magnetoresistance has been found as large as 80 % at 4. 2 K and 50 % at room temperature. In addition to such gigantic mag netoresistance, these multi layers indicate anti ferromagnetic and ferromag netic oscillation behavior with an increase in the thickness of the layers of the non magnetic component. These interesting properties of the new synthetic flmctional materials are attributed to their periodic and interracial structures at a microscopic level, although the origin of such peculiar features is not fully understood. Information on the surface structure or the number density of atoms in the near surface region may provide better insight. Amorphous alloys, frequently referred to as metallic glasses, are produced by rapid quenching from the melt. The second generation amorphous alloys, called "bulk amorphous alloys," have been discovered in some Pd based and Zr based alloy systems, with a super cooled liquid region at more than 120 K. In these alloy systems, one can obtain a sample thickness of several centime ters. Growing scientific and technological curiosity about the new amorphous alloys has focused on the fundamental factors, such as the atomic scale struc ture, which are responsible for the thermal stability with certain chemical compositions.

General

Imprint:	Springer-Verlag
Country of origin:	Germany
Series:	Springer Tracts in Modern Physics, 179
Release date:	October 2013
First published:	2002
Authors:	Yoshio Waseda
Dimensions:	235 x 155 x 12mm (L x W x T)
Format:	Paperback
Pages:	214
Edition:	Softcover reprint of the original 1st ed. 2002
ISBN-13:	978-3-662-14637-8
Categories:	Books > Professional & Technical > Mechanical engineering & materials > Materials science > Testing of materials > General
LSN:	3-662-14637-1
Barcode:	9783662146378

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!