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Throughout the 1980s and 1990s, the theory and practice of testing
electronic products has changed considerably. Quality and testing
have become inextricably linked and both are fundamental to the
generation of revenue to a company, helping the company to remain
profitable and therefore survive. Testing plays an important role
in assessing the quality of a product. The tester acts as a filter,
separating good products from bad. Unfortunately, the tester can
pass bad products and fail good products, and the generation of
high quality tests has become complex and time consuming. To
achieve significant reduction in time and cost of testing, the role
and responsibility of testing has to be considered across an entire
organization and product development process. Testability Concepts
for Digital ICs: The Macro Test Approach considers testability
aspects for digital ICs. The strategy taken is to integrate the
testability aspects into the design and manufacturing of ICs and,
for each IC design project, to give a precise definition of the
boundary conditions, responsibilities, interfaces and
communications between persons, and quality targets. Macro Test, a
design-for-Testability approach, provides a manageable test program
route. Using the Macro Test approach, one can explore alternative
solutions to satisfy pre-defined levels of performance (e.g. defect
detection, defect location, test application) within a pre-defined
cost budget and time scale. Testability Concepts for Digital ICs is
the first book to present a tried and proven method of using a
Macro approach to testing complex ICs and is of particular interest
to all test engineers, IC designers and managers concerned with
producing highquality ICs.
Preface Testing Integrated Circuits for manufacturing defects
includes four basic disciplines. First of all an understanding of
the origin and behaviour of defects. Secondly, knowledge of IC
design and IC design styles. Thirdly, knowledge of how to create a
test program for an IC which is targeted on detecting these
defects, and finally, understanding of the hardware, Automatic Test
Equipment, to run the test on. All four items have to be treated,
managed, and to a great extent integrated before the term 'IC
quality' gets a certain meaning and a test a certain measurable
value. The contents of this book reflects our activities on
testability concepts for complex digital ICs as performed at
Philips Research Laboratories in Eindhoven, The Netherlands. Based
on the statements above, we have worked along a long term plan,
which was based on four pillars. 1. The definition of a test
methodology suitable for 'future' IC design styles, 2. capable of
handling improved defect models, 3. supported by software tools,
and 4. providing an easy link to Automatic Test Equipment. The
reasoning we have followed was continuously focused on IC qUality.
Quality expressed in terms of the ability of delivering a customer
a device with no residual manufacturing defects. Bad devices should
not escape a test. The basis of IC quality is a thorough
understanding of defects and defect models."
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