0
Your cart

Your cart is empty

Books > Professional & Technical > Energy technology & engineering > Electrical engineering

Buy Now

Testability Concepts for Digital ICs - The Macro Test Approach (Paperback, Softcover reprint of the original 1st ed. 1995) Loot Price: R4,011
Discovery Miles 40 110
Testability Concepts for Digital ICs - The Macro Test Approach (Paperback, Softcover reprint of the original 1st ed. 1995):...

Testability Concepts for Digital ICs - The Macro Test Approach (Paperback, Softcover reprint of the original 1st ed. 1995)

F.P.M. Beenker, R.G. Bennetts, A.P. Thijssen

Series: Frontiers in Electronic Testing, 3

 (sign in to rate)
Loot Price R4,011 Discovery Miles 40 110 | Repayment Terms: R376 pm x 12*

Bookmark and Share

Expected to ship within 18 - 22 working days

Preface Testing Integrated Circuits for manufacturing defects includes four basic disciplines. First of all an understanding of the origin and behaviour of defects. Secondly, knowledge of IC design and IC design styles. Thirdly, knowledge of how to create a test program for an IC which is targeted on detecting these defects, and finally, understanding of the hardware, Automatic Test Equipment, to run the test on. All four items have to be treated, managed, and to a great extent integrated before the term 'IC quality' gets a certain meaning and a test a certain measurable value. The contents of this book reflects our activities on testability concepts for complex digital ICs as performed at Philips Research Laboratories in Eindhoven, The Netherlands. Based on the statements above, we have worked along a long term plan, which was based on four pillars. 1. The definition of a test methodology suitable for 'future' IC design styles, 2. capable of handling improved defect models, 3. supported by software tools, and 4. providing an easy link to Automatic Test Equipment. The reasoning we have followed was continuously focused on IC qUality. Quality expressed in terms of the ability of delivering a customer a device with no residual manufacturing defects. Bad devices should not escape a test. The basis of IC quality is a thorough understanding of defects and defect models."

General

Imprint: Springer-Verlag New York
Country of origin: United States
Series: Frontiers in Electronic Testing, 3
Release date: October 2012
First published: 1995
Authors: F.P.M. Beenker • R.G. Bennetts • A.P. Thijssen
Dimensions: 235 x 155 x 12mm (L x W x T)
Format: Paperback
Pages: 212
Edition: Softcover reprint of the original 1st ed. 1995
ISBN-13: 978-1-4613-6004-9
Categories: Books > Professional & Technical > Energy technology & engineering > Electrical engineering > General
Books > Professional & Technical > Electronics & communications engineering > Electronics engineering > Circuits & components
Promotions
LSN: 1-4613-6004-8
Barcode: 9781461360049

Is the information for this product incomplete, wrong or inappropriate? Let us know about it.

Does this product have an incorrect or missing image? Send us a new image.

Is this product missing categories? Add more categories.

Review This Product

No reviews yet - be the first to create one!

Partners